REHOVOT, ISRAEL: Nova Measuring Instruments Ltd, provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, announced that its suite of metrology tools were selected by a leading foundry in Asia to be the baseline tool of record for CMP process development of its most advanced technology node.
Nova selection was a result of a detailed qualification process in which the tools' ability to measure the most challenging process characteristics was evaluated. The suite of products selected includes Nova's most advanced integrated and standalone metrology tools combined with Nova's modeling software solution. The company expects to receive multiple tool orders for this technology node once the customer completes the process development and moves to high volume manufacturing.
Gabi Seligsohn, president and CEO of Nova, said: "We are delighted with the continued trust this strategic customer places in Nova as the preferred Optical CD solution provider for its needs over the last several years. Our ability to deliver a market leading suite of products to cater for the most advanced technology requirements was successfully put to a test against other competing solutions.
"Partnering with the world's leading foundries to develop process control solutions is of great importance to us and we continue to see the huge benefits offered to us and our customers as a result of these collaborations. Our ability to meet the requirements of the most advanced technology nodes with a combination of standalone and integrated metrology tools is a major proof point for Nova's superior technology."