Friday, December 23, 2011

Aehr Test Systems receives high-power burn-in system order

FREMONT, USA: Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, announced receipt of an order in excess of $1 million for its advanced ABTS high power burn-in system from one of the world's largest semiconductor manufacturers. The system is expected to ship this fiscal year.

Rhea Posedel, chairman and CEO, Aehr Test Systems, said: "We are encouraged because this is a major account win for our advanced ABTS logic burn-in system. Importantly, we hope that this could lead to additional system orders for new device qualifications."

"We believe that this customer purchased the ABTS system because it is a cost effective solution for high power logic burn in requiring individual temperature control per device" said Carl Buck, VP of sales and marketing of Aehr Test Systems.

"The ABTS system's 256 universal pin drivers and pattern generator per burn-in board are designed to make it an ideal tool for reliability testing and burn-in of the latest technology mobile processors and microprocessors."

The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It is designed to test and burn-in memory as well as both high-power logic and low-power logic in addition to high pin count logic. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.

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