Aehr Test Systems receives order for its new advanced burn-in and test system (ABTS)

FREMONT, USA: Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, has received an order for its new Advanced Burn-in and Test System (ABTS) from a leading Japanese semiconductor integrated device manufacturer (IDM).

The system is configured for burning-in and testing advanced logic devices. The system is expected to ship during the second half of calendar 2010.

"We are pleased to have received this order for a new member of the ABTS family of systems," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems.

"We believe this order confirms the flexibility, quality and cost-effectiveness of the ABTS system for production burn-in and test of packaged ICs. The specific configuration this customer ordered is optimized to easily integrate into the customer's existing infrastructure, reinforcing the ABTS system's high degree of modularity and configurability. We hope to receive follow-on production orders for this version of the ABTS system."

The ABTS family of products is based on a completely new hardware and software architecture that addresses not only today's devices, but also future devices for many years to come. The system can test and burn-in memory devices as well as both high and low-power logic devices.

The ABTS system can be configured to provide individual device temperature control for devices up to 100W or more and with up to 320 I/O channels. It uses an N+1 redundant technology for many key components in the system. This is intended to provide the highest possible system uptime.