Accel-RF announces shipment of first millimeter-wave reliability test system

SAN DIEGO, USA: Accel-RF Corp. announced the shipment and successful installation of its first millimeter-wave reliability and performance characterization test system.

The turnkey system independently performs RF life-tests and accelerated-aging performance characterization tests on 8 to 16 devices simultaneously. The system stresses components with elevated temperature; fixed, pulsed, or stepped DC bias; and elevated CW or pulsed millimeter-wave power to frequencies beyond 77 GHz.

This is another significant addition to the Accel-RF family of RF reliability and performance characterization test systems.

Roland Shaw, president and founder of Accel-RF, said: “Accel-RF introduced a High Power System to test application-specific GaN power devices and MMICs last year. Now our new millimeter-wave systems significantly broaden the capability to perform RF characterization and aging effects on new compound semiconductor as well as traditional device technologies.”

Accel-RF designs, manufactures and sells reliability test equipment to compound semiconductor manufacturers, military component manufacturers, defense contractors, and the tri-services wide-bandgap component teams.

“Accel-RF now has RF Reliability systems for applications ranging from cell phones, to WiFi, to Radar, to Satellite and Military communications,” added Shaw. “And these systems are not only available, but installed and providing a capability for our customers to find and improve the reliability and performance degradation of their products.”