Friday, May 31, 2013

Aehr Test Systems announces first production orders for next-gen FOX semiconductor test systems

USA: Aehr Test Systems announced that it has received an order totaling nearly $2 million, with a 30 percent down payment, for multiple production systems of its next-generation FOX Semiconductor Test System from a leading manufacturer of flash memory devices. The systems are expected to ship in the first half of calendar 2014.

The next generation FOX-1P extends the capabilities of the Aehr Test FOX-1 by adding high density, low cost I/O and DPS modules with the capability to provide over 16,000 I/O or DPS channels in a single test head for massive parallelism on a single wafer. It has resources to test over 10,000 die on a single wafer with individual DPS channels. Each channel has current monitoring and provides protection of the device and the probe cards that connect the test system to the devices under test.

Aehr Test's FOX family of products is focused on full wafer high reliability test and sort test needs for products such as automotive ICs, memories and devices with embedded memories, including microcontrollers and smart cards,

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