Wednesday, May 29, 2013

Test Vision 2020 to address emerging test strategies, technologies, and application challenges

USA: Critical trends and developments in the technologies, methodologies, applications challenges in semiconductor test will be presented at the 6th annual IEEE Test Vision 2020 Workshop held in conjunction with SEMICON West 2013, on July 10-11 at the San Francisco Marriot Marquis Hotel.

The one and one-half day workshop will feature speakers from Flextronics, Broadcom, Qualcomm, Texas Instruments, AMD, ON Semiconductor, Mentor Graphics, Micron, along with those from key semiconductor test industry suppliers.

Organized by SEMI and sponsored by the IEEE Instrumentation and Measurement Society, Test Vision 2020 is a two-time winner of the ATE Test Technology Technical Council’s “Most Successful Event” Award.  Registration for Test Vision 2020 is now open at , and includes free admission to SEMICON West.

Test Vision 2020 has become the leading venue to learn, forecast and debate the future of semiconductor test and serves as a valuable platform where leading foundries, IDMs and fabless companies discuss their critical test requirements with leading test equipment and solution providers.

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