FREMONT, USA: Aehr Test Systems has received a follow-on production order for its ABTS Advanced Burn-in and Test System from a leading provider of embedded wireless technology. The system is configured for burning-in and testing advanced logic devices.
"The follow-on order shows that the burn-in and test process using the ABTS system is effective for this customer's wireless devices for the automotive market, which requires that the ICs be qualified to operate very reliably in a harsh environment," said Carl Buck, VP of sales and marketing at Aehr Test Systems. "We see increasing demand not only for the standard ABTS system, but also for other members of the ABTS family that focus on high-power logic."
The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it maximizes system uptime by using N+1 redundancy technology for many key components in the system.