Friday, March 30, 2012

Aehr Test Systems receives follow-on production order from automotive IDM for ABTS

FREMONT, USA: Aehr Test Systems has received an additional follow-on production order for its ABTS Advanced Burn-in and Test System from a leading Japanese semiconductor integrated device manufacturer (IDM). The system is configured for burning-in and testing advanced logic devices.

"We are pleased to receive this additional follow-on order for an ABTS system, as we have worked closely with this customer to meet their very demanding requirements for high volume burn-in and test of microcontrollers for the automotive market," said Carl Buck, VP of sales and marketing at Aehr Test Systems. "The system is for additional burn-in and test capacity at one of their Southeast Asian production sites, which helps them satisfy the demands of the automobile manufacturers for 'zero defects' in the components they purchase."

The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it maximizes system uptime by using N+1 redundancy technology for many key components in the system.

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