FREMONT, USA: Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, has received an order for its ABTS Advanced Burn-in and Test System from a leading test lab in Korea. The system is configured for burning-in and testing high-power advanced logic devices.
"We are pleased to receive this order for an ABTS-Li system from a leading Korean test lab that is targeting reliability qualifications of high pin-count ICs requiring individual temperature control per device, such as mobile and tablet microprocessors," said Carl Buck, vice president of sales and marketing at Aehr Test Systems.
"The ABTS system offers up to 256 universal pin drivers per device with up to 32 million test vectors per pin. Functional testing during burn-in helps ensure that the devices are receiving the proper stimulus during the entire reliability qualification process, which often lasts 6 weeks or longer. We expect the highly flexible and robust ABTS system to be an excellent fit for this environment."
The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it maximizes system uptime by using N+1 redundancy technology for many key components in the system.