Wednesday, February 22, 2012

Si2 to present OpenDFM at ISQED

ISQED 2012, AUSTIN, USA: The Silicon Integration Initiative (Si2) will present details and a demonstration of the Open Design for Manufacturability (OpenDFM) standard at the International Symposium on Quality Electronic Design (ISQED) which will be held March 19-21 at the TechMart Center in Santa Clara, CA. The presentation will take place on Monday, March 19, from 6PM-7PM, and will be followed by a networking reception with refreshments.

Open Design for Manufacturability (OpenDFM) is an open standard from Si2 that uses pattern descriptors, instead of DRC rules, to describe the intent of physical verification and DFM optimization. The OpenDFM presentation will describe how a standard set of pattern descriptors can describe layout patterns that increase yield, patterns that reduce yield and patterns the violate fundamental ground rules.

The recent addition of DRC+ technology provides an alternative to expensive and time consuming lithographic and CMP simulations to find the critical yield defects hidden in the layout. OpenDFM not only identifies thousands of hotspots but uses targeting technology to reduce or eliminate the majority of hotspots with no increase in silicon area or loss of performance.

The presentation will include a real-time demonstration of processing a single set of OpenDFM rules that are translated and optimized into native rule decks for Mentor, Cadence, Synopsys and Magma physical verification tools.

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