Magma, Camtek team to enhance yield of advanced semiconductors

BANGALORE, INDIA: Magma Design Automation Inc. today announced that Camtek Ltd has integrated Magma’s YieldManager software into Falcon, Camtek’s flagship line of automated wafer inspection and metrology systems, and will sell it as an option.

The combination of Camtek’s automated inspection platforms and Magma’s YieldManager allows fab engineers to more effectively analyze inline defect data and yield data to accelerate root cause identification of yield problems, ensuring higher yields and reducing manufacturing costs.

Camtek systems deliver outstanding 2D and 3D capabilities in a versatile and flexible platform that meets the evolving demands of any design application. Cleanroom compatibility and compliance with factory automation standards allows Camtek systems to fit seamlessly into the most advanced production environments.

YieldManager is a customizable yield-management software system that allows engineers to collect, correlate, analyze and share critical data. YieldManager combines high-level correlation of data from disparate sources with the rapid drill-down of data scope to expedite root-cause identification of yield-limiting problems, saving engineering time and focusing resources.

The joint Magma-Camtek solution allows semiconductor fab and lab analysis teams to more quickly and easily locate potential defects and make corrections faster.

“Minimizing manufacturing costs while ensuring reliability are critical factors for semiconductor success,” said Rafi Amit, CEO of Camtek. “By enabling faster identification of yield problems, Magma and Camtek help semiconductor customers achieve their cost, performance and time-to-market goals.”

“Advanced fabs have an array of sophisticated equipment that provides engineers with an unprecedented amount of information about the IC, but analysis of the data is time consuming,” said Ankush Oberai, vice president of Magma’s Fab Analysis Business Unit.

“With YieldManager software and the Falcon systems, designers can more quickly and efficiently leverage the information from the automated wafer inspection system to make changes in the IC manufacturing process that enhance yield.”