WILSONVILLE, USA: Mentor Graphics Corp. announced the results of an extensive evaluation by the Tokyo-based Semiconductor Technology Academic Research Center (STARC) that showed the Calibre xACT 3D extraction product delivers both reference level accuracy and high performance, enabling very high quality extraction for large IPs.
“Our benchmark included a wide range of evaluation data ranging from small cells and routing patterns up to large blocks,” said Kunihiko Tsuboi, Senior Manager of Mixed Signal Design Group/Development Department-2 at STARC. “We found that Calibre xACT 3D closely matched our reference values and, at the same time, demonstrated performance and capacity sufficient to handle multi-million transistor SRAMs, not just small cells. We also found xACT 3D to be an excellent tool for analyzing parasitic capacitances associated with transistor-level devices.”
“Calibre xACT 3D is a new generation of extraction tool that overcomes the traditional quandary faced by users—having to choose between accuracy and performance,” said Michael Buehler-Garcia, Director of Marketing for Calibre Design Solutions at Mentor Graphics.
“Because Calibre xACT 3D provides field solver accuracy at speeds that meet customers’ cycle time requirements, designers of advanced node ICs now have extraction to support better modeling of circuit performance from the transistor all the way up to full chip critical nets.”
Subscribe to:
Post Comments (Atom)
No comments:
Post a Comment
Note: Only a member of this blog may post a comment.