MIGDAL HAEMEK, ISRAEL: Camtek Ltd announced that a leading semiconductor equipment supplier has selected the Xact, Camtek's Advanced STEM/TEM (Scanning Transmission Electron Microscope) sample preparation solution, enabling material analysis and verification.
The Xact system will be installed in the second quarter of 2010.
Shrinking feature dimensions and advances in material complexity require a scale of analysis only supplied by STEM and TEM. Sample preparation for front end of the line (FEOL) process monitoring and offline failure analysis has become a bottleneck.
Existing sample preparation solutions are falling short of meeting the evolving requirements of high resolution and high contrast imaging and analysis. Camtek's Xact overcomes these limitations by applying the ground-breaking Adaptive Ion Milling (AIM(TM)) technology, and offers negligible artifacts and improved throughput for customers.
The Xact was developed by SELA - Semiconductor Engineering Laboratories Ltd, who was acquired by Camtek in November 2009.
Roy Porat, Camtek's General Manager commented: "We are very pleased to announce this first order by us within only a few months from the completion of the acquisition of SELA. This is an achievement that justifies our belief in the viability of the Sela acquisition and business potential.
"Based on our strong technological advantage, we believe this order of the Xact is a first step towards a successful penetration to a very significant potential market estimated by us today at $150 million with potential for a substantial growth in coming years."
Friday, April 16, 2010
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