Friday, February 26, 2010

ABOV Semiconductor purchases J750 for microcontroller testing

NORTH READING, USA: Teradyne Inc. announced that ABOV Semiconductor, a fabless microcontroller semiconductor company, selected the J750 test system for characterization and production test of its portfolio of 8-bit and 32-bit microcontrollers. The first system has been installed at ABOV’s Ochang research and development site in South Korea.

After evaluating alternative solutions in the marketplace, ABOV selected the J750 because it offers the best economic value and most complete digital performance and analog measurement coverage for their wide range of microcontroller products. ABOV also valued the broad adoption of the J750 in the marketplace as thousands of systems are installed and widely available at subcons and Outsourced Semiconductor Assembly and Test (OSAT) facilities.

“The broad market acceptance of the J750 and its ability to meet all the wafer sort and final test insertion measurement requirements across ABOV’s microcontroller product lines was extremely attractive,” said Junghoon Kim, director of Production Division, ABOV Semiconductor. “In addition, the J750 offers the headroom to handle our future testing needs by giving us the ability to scale up to their Ex instrumentation when the timing is right.”

“The J750 platform is the ideal choice in the marketplace for microcontroller test,” said Kyle Klatka, Consumer Digital Market Segment manager, Teradyne. “We are pleased that ABOV selected the J750 as it continues to offer the most compelling cost of test economics for price-sensitive, consumer digital applications and is readily available at dozens of subcons.”

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