KUALA LUMPUR, MALAYSIA: Unisem announces the addition of LTX-Credence’s PAx RF Test System to its US- based test development center located in Sunnyvale, CA. This system is a “super set”, fully loaded with all the features the PAx test platform has to offer for cost effective test development and production test of the latest generation of front end RF devices.
LTX-Credence’s new test system has been specifically developed to address the high volume manufacturing test challenges of suppliers of advanced front end RF devices such as Multiband RF Power Amplifiers, RF Front End Modules, RF Analog System in Package and RF discrete devices. Leveraging the X-Series XRF test instrumentation, the PAx enables cost effective, high-volume performance testing of advanced front end RF devices used in applications utilizing WLAN, WiMAX, GSM, Edge CDMA, WCDMA, LTE, Bluetooth or other RF signaling standards.
"The RF front end device market is being driven by three key dynamics: higher levels of functionality, high unit volume growth and constant pricing pressures. The PAx has been developed to meet the challenges caused by these dynamics," commented John Shelley, product director, LTX-Credence. "We are excited that Unisem’s Sunnyvale test development center has chosen the PAx platform to serve as the tester of choice for this market segment.”
"The addition of the PAx test system from LTX-Credence is another example of Unisem’s continued commitment to positioning Unisem Sunnyvale at the forefront of the group’s test equipment roadmap,” said Marita Erickson, general manager, Unisem-Sunnyvale. "Sunnyvale serves as a development center where we work hand in hand with customers to create the optimum test solutions, get them production ready, and when appropriate, move them to our high volume factories in Asia."
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