REHOVOT, ISRAEL: Nova Measuring Instruments Ltd, a provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, has announced a first standalone optical CD metrology order from a large DRAM manufacturer.
The company further reported that this standalone order is part of a multimillion dollar deal which also includes multiple integrated metrology optical CD systems. The majority of the systems will be shipped during the second and third quarters of this year.
Noam Shintel, director of Corporate Marketing, said: "This additional customer acquisition further solidifies our market position, and is of strategic importance, given our expectation that in the near future Optical CD will play a more significant role in DRAM manufacturing. This particular customer will be deploying a combination of our integrated and stand alone metrology solutions for thin film and optical CD measurements, at advanced technology nodes in Etch, CVD and CMP."
Gabi Seligsohn, president & CEO, further added: "Given the continued global demand for high-end semiconductor devices, our major customers have recently moved from fab expansion announcements to actual tool bookings and deployment, at an accelerating pace. With our expanded product portfolio, we are playing a larger role in new capacity build-ups, and are well positioned to continue capitalizing on these positive trends."