Thursday, June 23, 2011

TI high-temperature H.E.A.T. evaluation module speeds safe testing of electronics for harsh and hot environments

DALLAS, USA: Texas Instruments Inc. (TI) introduced the H.E.A.T. (harsh environment acquisition terminal) evaluation module (EVM), the industry's first high-temperature data acquisition system, which includes a complete set of TI signal chain components qualified for extreme temperature operation from -55 degrees Celsius (C) to 210 degrees C.

The H.E.A.T. EVM is test-oven ready and qualified to operate up to 200 hours at oven temperatures of up to 200 degrees C. It accepts eight channels of analog data and conditions, digitizes and processes these signals for a variety of applications in ruggedized, high-temperature environments including downhole drilling, jet engines and heavy industrial applications.

The H.E.A.T. EVM eliminates the need for expensive up-screening and qualification testing of industrial-grade components for temperature ranges outside their datasheet specifications. The tool allows manufacturers to develop applications with components qualified for harsh environments quickly and safely and cuts development, testing and qualification time by up to one year.

The H.E.A.T. EVM complements TI's full portfolio of analog and embedded processing products for high-temperature, high-reliability environments. The board is immediately available for $5,749.

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