FREMONT, USA: Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, announced today that it received over $1 million in orders during the second quarter of fiscal 2010 for FOX-1 system upgrades from a leading flash memory manufacturer.
"We are very excited to have received these follow-on orders," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems.
"This is an indication of our customer's need to increase capacity for testing new flash memories that they are developing or have already introduced into the market. The FOX-1 system, using a WaferPak contactor, allows parallel testing of thousands of die on a 300mm wafer with only a single touchdown. We believe that these follow-on purchases confirm that the FOX-1 full wafer test technology has proven to lower the cost of wafer sort test for our customer."
The FOX-1 full wafer parallel test system, a member of the FOX family of full wafer contact systems, is most effective for test and short burn-in applications. Other members of Aehr Test's FOX family of products, such as the FOX-15 and FOX-V, are focused on long-duration full wafer burn-in and test of products such as automotive ICs, DRAMs and VCSELs (laser diodes).