SAN JOSE, USA: PDF Solutions, Inc., the leading provider of yield improvement technologies and services for the IC manufacturing process life cycle, announced that it is collaborating with Samsung Electronics Corp. to further the enhancement of PDF Solutions’ YieldAware Fault Detection and Classification (YA-FDC) solution.
The improved YA-FDC solution is intended to reduce process variability in Samsung’s fabs by controlling process tool health with models that predict the impact of tool sensor signals on final product yield.
“We are very impressed with the YA-FDC solution that controls the undesirable factors of process tools by modeling fab-wide FDC signals with product yield, and we appreciate the opportunity to further the development of an improved system with PDF Solutions, one of the world’s leading commercial providers of yield enhancement solutions," said Dr. C.S. Choi, Executive Vice President of System LSI Division, Samsung Electronics. “We look forward to enhancements to the current system for tool management, as well as reductions in process variability due to the tool variations at leading-edge technology nodes."
“We are pleased to work with Samsung to extend the industry’s only comprehensive system to model the impact of FDC signals on product yield and performance," stated David Joseph, Chief Strategy Office of PDF Solutions. "The integrated offering is designed to tie tool parameter data with product yield information to improve product performance and reduce the cost of good die. The YA-FDC solution creates models that predict future product results from current wafer-by-wafer tool signals. Our work with Samsung is intended to help reduce variability in Samsung’s high volume fabs running its most advanced products."