Keithley upgrades semiconductor test software for high throughput wafer production test

CLEVELAND, USA: Keithley Instruments Inc. introduced an upgrade to its popular Keithley Test Environment (KTE) semiconductor test software. KTE Version 5.3 is designed for use with Keithley’s S530 Parametric Test Systems, the company’s fastest, most cost-effective line of process control monitoring solutions to date.

KTE is a powerful test development and execution software platform that has served hundreds of semiconductor fabs worldwide with Keithley’s previous-generation parametric test systems. Now, Keithley’s S530 test systems can leverage the same industry-proven software platform, providing flexible test plan development and high speed test execution for even the most demanding production environments.

Users of existing Keithley S400 and S600 Series parametric testers especially benefit from KTE Version 5.3 on the S530 because existing measurement routines can easily be ported to the S530, and identical test plans can be shared between existing testers and new S530 systems.

Extending the KTE test development and execution environment to S530 systems brings together the advantages of Keithley’s three decades of field experience in parametric test code development with the fastest, most advanced system hardware available in the market. S530 instrumentation provides the speed and wide measurement range that parametric test applications like process control monitoring demand.

Keithley is committed to supporting its parametric test customers by providing new test systems that are highly compatible with its earlier systems. This commitment to maintaining software compatibility ensures a smoother migration path and protects fabs’ test software investment when adding newer, faster testers to their test floors. For new Keithley parametric test customers, this commitment to system software continuity means they can be confident their test systems are based on industry-proven software.