MIGDAL HAEMEK, ISRAEL: Sales momentum continues as Jordan Valley Semiconductors Ltd. (JVS), a leading supplier of advanced process control X-Ray based metrology systems for the manufacturing of semiconductors and high brightness LED, announced today the receipt of a $10M capacity order of multiple JVX6200i Metrology tools from a tier one semiconductor manufacturer.
Isaac Mazor, CEO and President of Jordan Valley Semiconductors, noted: "This capacity order further validates our customers' continued confidence in Jordan Valley's X-ray metrology to meet their advanced process control requirements."
The JVX6200i was designed for high volume production metrology with full automation, high throughput, high uptime and low COO.
The JVX6200i is a multi-channel metrology tool for advanced semiconductors FEOL, BEOL and Wafer-level Packaging (WLP) applications. The popular configuration is XRF (X-ray Fluorescence) and XRR (X-Ray reflectance) for FEOL (Hi-K, Metal gate, SiON and ACL applications) and BEOL (Cu Seed Barrier, Cu CMP and UBM applications).
New WAXRD (Wide Angle X-ray diffraction)configuration is targeting metrology of advanced metallization structures with in-line capabilities of monitoring grain size, texture and phase of the seed/barrier and Cu or W metal structures.
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