Tektronix SuperSpeed test solution supports world’s first USB 3.0 certification at NEC Electronics

BANGALORE, INDIA: Tektronix Inc. announced that its SuperSpeed USB solution supported the verification of signal quality for NEC Electronics Corporation’s USB 3.0-compatible host controller –- the world’s first to obtain USB 3.0 certification from the USB Implementers Forum.

NEC Electronics, a global leader in the design and production of integrated circuits, worked with Tektronix to validate that its new silicon components meet the requirements of the emerging SuperSpeed USB standard (USB3.0). USB technology has quickly become recognized as the industry standard for connecting PCs and peripheral devices.

Comparable to other state-of-the-art high-speed interfaces such as PCI Express 2.0 and SATA Gen 3, the performance of USB 3.0, which can support a data rate of up to 5Gbps, can pose complicated measurement challenges. To resolve these challenges, measurement devices with high levels of performance and flexibility, as well as tools to speed and simplify the design, measurement, and analysis processes are required.

The Tektronix Test Solution for USB 3.0 provides engineers like those at NEC Electronics with the capability to perform characterization, debug, and compliance testing of their USB devices and automates margin and compliance testing. For critical USB 3.0 receiver margin testing, the Tektronix AWG7122B arbitrary waveform generator provides unmatched signal generation flexibility – helping to bring USB 3.0-compatible products to market faster.

“Tektronix has been working closely with NEC Electronics on the verification, testing, and debugging of SuperSpeed USB,” said Dave Slack, marketing manager, Technology Solutions Group, Tektronix, Inc. “Today, we are pleased to have contributed to the product development by NEC Electronics that led to the industry’s first USB 3.0 certification.”