Teradyne announces 10,240 I/O pin Magnum 2x for high-volume memory testing

NORTH READING, USA: Teradyne announced the introduction of a new member of its Magnum family of memory test solutions, the Magnum 2x. Capable of testing over 1,280 devices in parallel, the Magnum 2x delivers an unprecedented level of efficiency and low-cost for probe and package test.

While designed for massive parallel test applications, the Magnum 2x achieves speeds up to 800 Mb/s for full performance testing of memory and logic devices. Teradyne has shipped multiple Magnum 2x test systems to major customers in the Pacific Rim.

“The memory market continues to progress with greater densities and higher volumes—and cost is always a top priority for our customers,” said Tim Moriarty, vice president and general manager of memory products, Teradyne. ”We are very confident that the Magnum 2x, with its extended test capacity, will reinforce Teradyne's leadership position in low-cost, volume testing.”

Based on the successful Magnum 2 architecture, the 2x continues the Teradyne legacy as the leader in low-cost, high-throughput testing—with twice the pin count. Magnum 2x delivers the required flexibility allowing customers to choose the configuration that best fits their needs today, and in the future.

System configurations start with one chassis offering up to 1,280 pins; two chassis with up to 2,560 pins; four chassis with up to 5,120; and eight chassis with up to 10,240 pins—each with the same small footprint as Magnum 2. Additionally, test engineers can run their existing Magnum 2 test programs on the 2x; resulting in significant savings of time, resources and test costs.